gallium arsenide has been researched along with Sensitivity and Specificity in 15 studies
Timeframe | Studies, this research(%) | All Research% |
---|---|---|
pre-1990 | 0 (0.00) | 18.7374 |
1990's | 0 (0.00) | 18.2507 |
2000's | 14 (93.33) | 29.6817 |
2010's | 1 (6.67) | 24.3611 |
2020's | 0 (0.00) | 2.80 |
Authors | Studies |
---|---|
Bock, M; Buchenberg, WB; Dadakova, T; Groebner, J; Jung, B | 1 |
Fukui, T; Hara, S; Hua, B; Kobayashi, Y; Motohisa, J | 1 |
Joshi, C; Tochitsky, SY; Trubnick, SE | 1 |
Chan, CH; Chang, TH; Chen, CC; Chen, SH; Lee, CC; Su, YK; Wu, PH | 1 |
Arakawa, Y; Guimard, D; Iwamoto, S; Nomura, M; Tanabe, K | 1 |
Ayesheshim, A; Blanchard, F; Cocker, TL; Hegmann, FA; Kieffer, JC; Morandotti, R; Ozaki, T; Razzari, L; Reid, M; Sharma, G; Su, FH; Titova, LV | 1 |
Sarma, AK | 1 |
Li, F; Mi, Z | 1 |
Bratschitsch, R; Darmo, J; Kersting, R; Müller, T; Strasser, G; Unterrainer, K | 1 |
Planken, PC; Schouten, RN; van der Valk, N; Wenckebach, WT; Zhao, G | 1 |
Chamberlin, DR; Dubon, OD; Geisz, JF; Mars, DE; Scarpulla, MA; Walukiewicz, W; Wu, J; Yu, KM | 1 |
Darmo, J; Kröll, J; Müller, T; Parz, W; Strasser, G; Unterrainer, K | 1 |
Van Aert, S; Verbeeck, J | 1 |
Khachan, J; Mukherjee, B; Romaniuk, R; Rybka, D; Simrock, S | 1 |
Broomfield, CD; Everard, JK | 1 |
15 other study(ies) available for gallium arsenide and Sensitivity and Specificity
Article | Year |
---|---|
Comparison of two fiber-optical temperature measurement systems in magnetic fields up to 9.4 Tesla.
Topics: Arsenicals; Calibration; Electromagnetic Fields; Equipment Safety; Fiber Optic Technology; Gallium; Hyperthermia, Induced; Magnetic Resonance Imaging; Magnetic Resonance Imaging, Interventional; Phantoms, Imaging; Sensitivity and Specificity; Thermometry | 2015 |
Single GaAs/GaAsP coaxial core-shell nanowire lasers.
Topics: Arsenicals; Computer-Aided Design; Crystallization; Equipment Design; Equipment Failure Analysis; Gallium; Lasers; Lasers, Semiconductor; Macromolecular Substances; Materials Testing; Molecular Conformation; Nanostructures; Nanotechnology; Particle Size; Reproducibility of Results; Sensitivity and Specificity; Surface Properties | 2009 |
Fabrication and characterization of Teflon-bonded periodic GaAs structures for THz generation.
Topics: Arsenicals; Computer-Aided Design; Equipment Design; Equipment Failure Analysis; Gallium; Lasers, Gas; Microwaves; Polytetrafluoroethylene; Reproducibility of Results; Sensitivity and Specificity | 2009 |
Efficiency enhancement in GaAs solar cells using self-assembled microspheres.
Topics: Arsenicals; Computer-Aided Design; Electric Power Supplies; Energy Transfer; Equipment Design; Equipment Failure Analysis; Gallium; Light; Microspheres; Refractometry; Reproducibility of Results; Scattering, Radiation; Sensitivity and Specificity; Solar Energy | 2009 |
Room temperature continuous wave operation of InAs/GaAs quantum dot photonic crystal nanocavity laser on silicon substrate.
Topics: Arsenicals; Computer-Aided Design; Equipment Design; Equipment Failure Analysis; Gallium; Indium; Lasers, Semiconductor; Nanotechnology; Quantum Dots; Reproducibility of Results; Sensitivity and Specificity; Silicon; Temperature | 2009 |
Terahertz pulse induced intervalley scattering in photoexcited GaAs.
Topics: Arsenicals; Computer-Aided Design; Equipment Design; Equipment Failure Analysis; Gallium; Optical Devices; Reproducibility of Results; Scattering, Radiation; Sensitivity and Specificity; Terahertz Radiation | 2009 |
Self-switching of solitons in an AlGaAs nanowire coupler.
Topics: Aluminum Compounds; Arsenicals; Computer-Aided Design; Equipment Design; Equipment Failure Analysis; Gallium; Light; Nanotubes; Optical Devices; Reproducibility of Results; Scattering, Radiation; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Telecommunications | 2009 |
Optically pumped rolled-up InGaAs/GaAs quantum dot microtube lasers.
Topics: Arsenicals; Computer-Aided Design; Equipment Design; Equipment Failure Analysis; Gallium; Indium; Lasers, Semiconductor; Miniaturization; Quantum Dots; Reproducibility of Results; Sensitivity and Specificity | 2009 |
Few-cycle THz generation for imaging and tomography applications.
Topics: Arsenicals; Crystallization; Crystallography; Electromagnetic Phenomena; Equipment Design; Equipment Failure Analysis; Gallium; Lasers; Materials Testing; Microwaves; Optics and Photonics; Photic Stimulation; Semiconductors; Sensitivity and Specificity; Spectrum Analysis; Tomography | 2002 |
A terahertz system using semi-large emitters: noise and performance characteristics.
Topics: Arsenicals; Crystallization; Crystallography; Electromagnetic Phenomena; Equipment Design; Equipment Failure Analysis; Gallium; Lasers; Materials Testing; Microwaves; Optics and Photonics; Photic Stimulation; Quality Control; Semiconductors; Sensitivity and Specificity; Spectrum Analysis; Stochastic Processes; Tellurium; Transducers; Zinc Compounds | 2002 |
Mutual passivation of electrically active and isovalent impurities.
Topics: Alloys; Arsenic; Arsenicals; Crystallization; Crystallography; Electric Impedance; Gallium; Materials Testing; Nitrogen; Semiconductors; Sensitivity and Specificity; Silicon; Temperature | 2002 |
Few-cycle terahertz generation and spectroscopy of nanostructures.
Topics: Arsenicals; Equipment Design; Equipment Failure Analysis; Gallium; Microwaves; Nanotechnology; Nanotubes; Reproducibility of Results; Semiconductors; Sensitivity and Specificity; Spectrophotometry, Infrared | 2004 |
Model based quantification of EELS spectra.
Topics: Arsenicals; Electron Probe Microanalysis; Electrons; Gallium; Models, Theoretical; Sensitivity and Specificity; Silver; Software; Spectrum Analysis | 2004 |
Application of low-cost Gallium Arsenide light-emitting-diodes as kerma dosemeter and fluence monitor for high-energy neutrons.
Topics: Arsenicals; Computer-Aided Design; Equipment Design; Equipment Failure Analysis; Gallium; Germany; Lighting; Neutrons; Photometry; Radiation Dosage; Radiation Monitoring; Radiation Protection; Reproducibility of Results; Semiconductors; Sensitivity and Specificity | 2007 |
Reduced transposed flicker noise in microwave oscillators using gaas-based feedforward amplifiers.
Topics: Amplifiers, Electronic; Arsenicals; Artifacts; Equipment Design; Equipment Failure Analysis; Gallium; Microwaves; Oscillometry; Reproducibility of Results; Sensitivity and Specificity; Time Factors | 2007 |