silicon and lead-titanate

silicon has been researched along with lead-titanate* in 1 studies

Other Studies

1 other study(ies) available for silicon and lead-titanate

Article	Year
Ferroelectric BiFeO3-PbTiO3 thin films on Pt/Si substrates. IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 2007, Volume: 54, Issue:12 In this work we report on the preparation and properties of bismuth ferrite lead titanate films [(1- x)BiFeO(3-x)PbTiO3] with tetragonal compositions (x = 0.8 and 0.7) and compare them with compositions close to the morphotropic phase boundary (MPB; x = 0.4 and 0.3). The films were prepared by pulsed laser deposition on Pt/Si substrates, and exhibited a dense columnar grain growth. X-ray diffraction analysis revealed that the films have a perovskite structure with a preferred (111) texture. The dielectric properties, polarization-field hysteresis, and leakage current behavior of the films is also reported. For MPB compositions, the films exhibited remanent polarizations with 2Pr up to 100 microC cm(-2) and E(c) approximately 185 kV cm(-1) under a maximum applied field of 500 kV cm(-1), while the tetragonal compositions exhibited 2Pr values in the range of 45-52 microC cm(-2) with a coercive field E(c) approximately 118 kV (-1). Topics: Ceramics; Crystallization; Electric Impedance; Iron; Lead; Materials Testing; Membranes, Artificial; Platinum; Silicon; Titanium	2007

Article

Year

Ferroelectric BiFeO3-PbTiO3 thin films on Pt/Si substrates.

IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 2007, Volume: 54, Issue:12

In this work we report on the preparation and properties of bismuth ferrite lead titanate films [(1- x)BiFeO(3-x)PbTiO3] with tetragonal compositions (x = 0.8 and 0.7) and compare them with compositions close to the morphotropic phase boundary (MPB; x = 0.4 and 0.3). The films were prepared by pulsed laser deposition on Pt/Si substrates, and exhibited a dense columnar grain growth. X-ray diffraction analysis revealed that the films have a perovskite structure with a preferred (111) texture. The dielectric properties, polarization-field hysteresis, and leakage current behavior of the films is also reported. For MPB compositions, the films exhibited remanent polarizations with 2Pr up to 100 microC cm(-2) and E(c) approximately 185 kV cm(-1) under a maximum applied field of 500 kV cm(-1), while the tetragonal compositions exhibited 2Pr values in the range of 45-52 microC cm(-2) with a coercive field E(c) approximately 118 kV (-1).

Topics: Ceramics; Crystallization; Electric Impedance; Iron; Lead; Materials Testing; Membranes, Artificial; Platinum; Silicon; Titanium

2007